JPH0371746B2 - - Google Patents

Info

Publication number
JPH0371746B2
JPH0371746B2 JP62126337A JP12633787A JPH0371746B2 JP H0371746 B2 JPH0371746 B2 JP H0371746B2 JP 62126337 A JP62126337 A JP 62126337A JP 12633787 A JP12633787 A JP 12633787A JP H0371746 B2 JPH0371746 B2 JP H0371746B2
Authority
JP
Japan
Prior art keywords
contact
positioning
package
elastic contact
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62126337A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63291375A (ja
Inventor
Shunji Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamaichi Electronics Co Ltd
Original Assignee
Yamaichi Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamaichi Electronics Co Ltd filed Critical Yamaichi Electronics Co Ltd
Priority to JP62126337A priority Critical patent/JPS63291375A/ja
Priority to US07/195,840 priority patent/US4887969A/en
Publication of JPS63291375A publication Critical patent/JPS63291375A/ja
Publication of JPH0371746B2 publication Critical patent/JPH0371746B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
    • H05K7/103—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers
    • H05K7/1046—J-shaped leads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K7/00—Constructional details common to different types of electric apparatus
    • H05K7/02—Arrangements of circuit components or wiring on supporting structure
    • H05K7/10—Plug-in assemblages of components, e.g. IC sockets
    • H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
    • H05K7/103—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers
    • H05K7/1038—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers with spring contact pieces

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP62126337A 1987-05-22 1987-05-22 Ｉｃソケット Granted JPS63291375A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP62126337A JPS63291375A (ja) 1987-05-22 1987-05-22 Ｉｃソケット
US07/195,840 US4887969A (en) 1987-05-22 1988-05-19 IC socket

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62126337A JPS63291375A (ja) 1987-05-22 1987-05-22 Ｉｃソケット

Related Child Applications (3)

Application Number Title Priority Date Filing Date
JP4280581A Division JPH07114137B2 (ja) 1992-09-26 1992-09-26 Ｉｃソケット
JP4280583A Division JPH07114139B2 (ja) 1992-09-26 1992-09-26 Ｉｃソケット
JP4280582A Division JPH07114138B2 (ja) 1992-09-26 1992-09-26 Ｉｃソケット

Publications (2)

Publication Number Publication Date
JPS63291375A JPS63291375A (ja) 1988-11-29
JPH0371746B2 true JPH0371746B2 (en]) 1991-11-14

Family

ID=14932679

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62126337A Granted JPS63291375A (ja) 1987-05-22 1987-05-22 Ｉｃソケット

Country Status (2)

Country Link
US (1) US4887969A (en])
JP (1) JPS63291375A (en])

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0636390B2 (ja) * 1989-03-22 1994-05-11 山一電機工業株式会社 Ｉｃソケット
JPH0711422Y2 (ja) * 1989-12-25 1995-03-15 山一電機工業株式会社 Ｉｃソケット
JPH0668983B2 (ja) * 1990-10-12 1994-08-31 山一電機工業株式会社 Ｉｃソケット
US5177436A (en) * 1991-05-21 1993-01-05 Aseco Corporation Contactor for testing integrated circuit chips mounted in molded carrier rings
GB2257849B (en) * 1991-06-28 1995-11-22 Digital Equipment Int Semiconductor chip test jig
JP2583696B2 (ja) * 1991-08-02 1997-02-19 三菱電機株式会社 Ｉｃソケット
JPH07105257B2 (ja) * 1991-09-13 1995-11-13 山一電機株式会社 Ｉｃソケット
JPH0675416B2 (ja) * 1991-12-20 1994-09-21 山一電機株式会社 接続器
JPH05183029A (ja) * 1991-12-27 1993-07-23 Texas Instr Japan Ltd ソケット
JPH07114138B2 (ja) * 1992-09-26 1995-12-06 山一電機株式会社 Ｉｃソケット
JPH07114137B2 (ja) * 1992-09-26 1995-12-06 山一電機株式会社 Ｉｃソケット
JPH0746625B2 (ja) * 1992-12-18 1995-05-17 山一電機株式会社 Ｉｃソケット
JPH0763081B2 (ja) * 1993-01-22 1995-07-05 山一電機株式会社 Ｉｃキャリア
JPH0760723B2 (ja) * 1993-02-22 1995-06-28 山一電機株式会社 Ｉｃソケット
US5521521A (en) * 1994-03-14 1996-05-28 Sgs-Thomson Microelectronics, S.R.L. Testing contactor for small-size semiconductor devices
EP0616223B1 (en) * 1993-03-15 1999-10-20 STMicroelectronics S.r.l. A testing contactor for small-size semiconductor power devices
JP2656901B2 (ja) * 1994-01-28 1997-09-24 山一電機株式会社 Ｉｃソケット
JPH07254469A (ja) * 1994-03-16 1995-10-03 Texas Instr Japan Ltd ソケット
KR0123780Y1 (ko) * 1994-11-01 1998-10-01 문정환 반도체디바이스용 소켓
JP3840667B2 (ja) * 1995-01-13 2006-11-01 株式会社エンプラス Ｉｃソケット
US5788513A (en) * 1995-01-11 1998-08-04 Enplas Corporation IC socket
JPH08227767A (ja) * 1995-02-21 1996-09-03 Nec Kyushu Ltd 半導体パッケージ用ソケット
US5869976A (en) * 1996-12-13 1999-02-09 Cirrus Logic, Inc. Fine alignment IC handler and method for assembling same
JP2980235B2 (ja) * 1997-04-17 1999-11-22 山一電機株式会社 Ｉｃパッケージ用ｉｃソケット
KR100331546B1 (ko) * 1999-04-28 2002-04-06 윤종용 반도체 패키지 검사공정의 소켓핀 및 이를 이용한 소켓
JP2002367747A (ja) * 2001-06-06 2002-12-20 Yamaichi Electronics Co Ltd Ｉｃソケット
JP3803099B2 (ja) * 2002-12-17 2006-08-02 山一電機株式会社 半導体装置用ソケット
JP4073439B2 (ja) * 2004-04-16 2008-04-09 山一電機株式会社 半導体装置用ソケット
WO2005106512A1 (ja) * 2004-04-30 2005-11-10 Advantest Corporation マニュアル試験用器具
JP4312685B2 (ja) * 2004-08-31 2009-08-12 山一電機株式会社 半導体装置の着脱方法、それが用いられる半導体装置の着脱装置、および半導体装置用ソケット
CN200987025Y (zh) * 2006-02-21 2007-12-05 富士康(昆山)电脑接插件有限公司 电连接器
TWM298775U (en) * 2006-03-17 2006-10-01 Giga Byte Tech Co Ltd Structure of chip adapter
EP2241957B1 (en) * 2008-02-22 2011-11-09 Research In Motion Limited Socket for a navigational tool in a handheld wireless communication device
US8154883B2 (en) * 2008-02-22 2012-04-10 Research In Motion Limited Navigation tool socket for a handheld wireless communication device
JP5232593B2 (ja) * 2008-10-20 2013-07-10 株式会社日本マイクロニクス 電気的接続装置
TW201236548A (en) * 2011-02-24 2012-09-01 Hon Hai Prec Ind Co Ltd Mounting apparatus for circuit card
CN102654786A (zh) * 2011-03-03 2012-09-05 鸿富锦精密工业（深圳）有限公司 板卡固定装置
CN103390826B (zh) * 2012-05-08 2016-02-24 赛恩倍吉科技顾问（深圳）有限公司 电连接器
JP6400342B2 (ja) * 2014-06-11 2018-10-03 株式会社エンプラス 電気部品用ソケット
CN105717441A (zh) * 2016-03-30 2016-06-29 中科芯集成电路股份有限公司 一种具有定位功能的用于集成电路测试分选机的测试夹具
CN113334273A (zh) * 2021-05-25 2021-09-03 北京无线电测量研究所 一种用于天线加工的弹性压紧装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3805159A (en) * 1969-09-15 1974-04-16 Delta Design Inc Contactor unit for integrated circuit testing
JPS4921417U (en]) * 1972-05-26 1974-02-23
US4341433A (en) * 1979-05-14 1982-07-27 Amp Incorporated Active device substrate connector
US4407555A (en) * 1981-03-19 1983-10-04 Amp Incorporated Cam actuated DIP test socket
JPS57158571A (en) * 1981-03-27 1982-09-30 Hitachi Ltd Measuring socket for small-sized semiconductor device
JPS5830295A (ja) * 1981-08-18 1983-02-22 Nec Corp 加入者回路
JPS5830295U (ja) * 1981-08-24 1983-02-26 山一電機工業株式会社 集積回路板用ソケツト
JPS5846550Y2 (ja) * 1981-11-05 1983-10-22 山一電機工業株式会社 集積回路実装板用コネクタ
US4739257A (en) * 1985-06-06 1988-04-19 Automated Electronic Technology, Inc. Testsite system
JPS6276274A (ja) * 1985-09-30 1987-04-08 日本電気株式会社 Ｉｃソケツト
JPS6276273A (ja) * 1985-09-30 1987-04-08 日本電気株式会社 Ｉｃソケツト
JPH0310627Y2 (en]) * 1985-10-03 1991-03-15
JPS6281046A (ja) * 1985-10-04 1987-04-14 Hitachi Electronics Eng Co Ltd Ｉｃハンドラの測定用ソケツト装置

Also Published As

Publication number Publication date
US4887969A (en) 1989-12-19
JPS63291375A (ja) 1988-11-29

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